Congratulations lill-Konferenza tekniċi NANO miżmuma b ' suċċess

| Updated: Nov 14, 2016
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Metroloġija NANO miżmuma l-Konferenza tekniċi fuq 9thNov. b ' suċċess. Aktar minn 150 nies jattendu l-Konferenza. Segwita huma l-lista ta ' isem ta ' kumpanija prinċipali.

Arja Ċina qawwa CorpIċ-ċentru tax-xafra
Iċ-ċentru tal-kejlDipartiment tal-kwalità
Dipartiment tal-ispezzjoniKejl ta ' l-ispazju
Il-grupp FareastIl-grupp keian


iffirma

Bussiness Manager biex jintroduċu NANO żvilupp

measuring machine

Inġinier minn Renishaw li jintroduċu sistema ta ' sonda

high accuracy measuring equipment renishaw probe head system

Inġinier minn biex esterni-Array jintroduċu RationalDMIS u Modus dan it SW

 practice measuring solutionsbridge type CMM

Teknika ta ' skambju

 gantry type coordinate measuring machine

 gear center arm measuring machine


Jekk jogħġbok jinforma lilna jekk xi mistoqsijiet jew parir

Tal-posta elettronika:overseas@CMM-nano.com

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